✦ LIBER ✦
Correlations between current-voltage characteristics and visible defect channels in thin SiO2 films after field stress
✍ Scribed by Krause, H. ;Bär, H.-P. ;Schulze, H.
- Publisher
- John Wiley and Sons
- Year
- 1988
- Tongue
- English
- Weight
- 155 KB
- Volume
- 108
- Category
- Article
- ISSN
- 0031-8965
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