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Correlation Spectroscopy of Surfaces, Thin Films, and Nanostructures || Two‐Electron Spectroscopy Versus Single‐Electron Spectroscopy for Studying Secondary Emission from Surfaces

✍ Scribed by Berakdar, Jamal; Kirschner, Jürgen

Publisher
Wiley-VCH Verlag GmbH & Co. KGaA
Year
2005
Weight
504 KB
Category
Article
ISBN
3527603425

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✦ Synopsis

Experimental results on the (e,2e) reaction on surfaces of a dielectric (LiF film), a metal (W(110) crystal) and a semiconductor (Si(001) crystal) are presented and discussed. A combined analysis of secondary emission spectra together with the (e,2e) spectra of LiF film allows one to establish a link between a "true secondary emission feature" and an energy loss process in the film. A comparison of the (e,2e) spectra of tungsten and silicon shows that the secondary emission mechanisms are different in these materials. The oxygen adsorption strongly modifies the distribution of correlated electron pairs from W(110).

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✍ Berakdar, Jamal; Kirschner, Jürgen 📂 Article 📅 2005 🏛 Wiley-VCH Verlag GmbH & Co. KGaA ⚖ 823 KB

Coincidence measurement of energy-selected electrons and mass-selected ions (electron-ion coincidence (EICO) spectroscopy) is a powerful technique to clarify the ion desorption mechanism induced by electron transitions, because excited states leading to ion desorption are directly identified. Inform