✦ LIBER ✦
Correlation of thin film adhesion with current noise measurements of Ta2N-Cr-Au resistors on sapphire and alumina substrates : W. E. Bibeau, W. A. Porter and D. L. Parker. Proc. IEEE 28th Electron. Components Conf., Anaheim, 24–26 April 1978, p. 427
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 129 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0026-2714
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