Correlation of the leakage current and charge pumping in silicon on insulator gate-controlled diodes

✍ Scribed by Seghir, K.; Cristoloveanu, S.; Jerisian, R.; Oualid, J.; Auberton-Herve, A.-J.

• Book ID: 114535139
• Publisher: IEEE
• Year: 1993
• Tongue: English
• Weight: 828 KB
• Volume: 40
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.214736