✦ LIBER ✦
Correlation of the decay of tunneling currents with trap generation inside thin oxides : N. A. Dumin, K. J. Dickerson, D. J. Dumin and B. T. Moore. Solid-State Electronics, 39 (5), 655 (1996)
- Book ID
- 108362317
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 143 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0026-2714
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