Correlation of stress-induced leakage current with generated positive trapped charges for ultrathin gate oxide

✍ Scribed by Yung Hao Lin; Chung Len Lee; Tan Fu Lei

• Book ID: 114537148
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 92 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.658697