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Correlation of silver migration with temperature-humiditybias (THB) failures in multilayer ceramic capacitors : Hung C. Ling and Anna M. Jackson. IEEE Trans. Comp. Hybrids Manufact. Tech. 12(1), 130 (March 1989)


Book ID
103282198
Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
269 KB
Volume
30
Category
Article
ISSN
0026-2714

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