✦ LIBER ✦
Correlation of grain boundary electrical properties with grain boundary impurities in multigrained silicon using surface analytical techniques
✍ Scribed by L.L. Kazmerski; P.J. Ireland
- Publisher
- Elsevier Science
- Year
- 1980
- Weight
- 659 KB
- Volume
- 1
- Category
- Article
- ISSN
- 0379-6787
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