✦ LIBER ✦
Correlation between the reliability of laser diodes and the crystal perfection of epitaxial layers estimated by high-resolution x-ray diffractometry
✍ Scribed by V. P. Evtikhiev; E. Yu. Kotel’nikov; I. V. Kudryashov; V. E. Tokranov; N. N. Faleev
- Book ID
- 110120090
- Publisher
- Springer
- Year
- 1999
- Tongue
- English
- Weight
- 187 KB
- Volume
- 33
- Category
- Article
- ISSN
- 1063-7826
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