Correlation between the free carrier lifetime and total amount of deep centers in ZnO single crystals

✍ Scribed by Vladimir Gavryushin; Arunas Kadys; Ramunas Aleksiejunas; Kestutis Jarasiunas

• Book ID: 106397960
• Publisher: Springer US
• Year: 2007
• Tongue: English
• Weight: 502 KB
• Volume: 19
• Category: Article
• ISSN: 0957-4522
• DOI: 10.1007/s10854-007-9490-3