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Correlation Between Measured Minority-Carrier Lifetime and Device Performance

โœ Scribed by Repins, I.L.; Metzger, W.K.; Perkins, C.L.; Li, J.V.; Contreras, M.A.


Book ID
114620163
Publisher
IEEE
Year
2010
Tongue
English
Weight
465 KB
Volume
57
Category
Article
ISSN
0018-9383

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