✦ LIBER ✦
Correlation between leakage current density and threading dislocation density in SiGe p-i-n diodes grown on relaxed graded buffer layers
✍ Scribed by Giovane, Laura M.; Luan, Hsin-Chiao; Agarwal, Anuradha M.; Kimerling, Lionel C.
- Book ID
- 121226356
- Publisher
- American Institute of Physics
- Year
- 2001
- Tongue
- English
- Weight
- 558 KB
- Volume
- 78
- Category
- Article
- ISSN
- 0003-6951
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