Correlation Between Flux Pinning Properties and Interfacial Defects in ${\rm YBa}_{2}{\rm Cu}_{3}{\rm O}_{7-\delta}/{\rm CeO}_{2}$ Multilayer Thin Films

✍ Scribed by Tsai, Chen-Fong; Zhu, Yuanyuan; Chen, Li; Wang, Haiyan

• Book ID: 119953334
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 953 KB
• Volume: 21
• Category: Article
• ISSN: 1051-8223
• DOI: 10.1109/TASC.2010.2101036