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Correlation between electrical properties and AES concentration-depth profiles of NiCr thin films

✍ Scribed by S. Hofmann; A. Zalar

Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 360 KB
Volume: 39
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(76)90639-8

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