✦ LIBER ✦
Correlation between 1/f noise and hFE long-term instability in silicon bipolar devices
✍ Scribed by Yiqi Zhuang; Qing Sun
- Book ID
- 114538932
- Publisher
- IEEE
- Year
- 1991
- Tongue
- English
- Weight
- 754 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0018-9383
- DOI
- 10.1109/16.97420
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