𝔖 Bobbio Scriptorium

✦ LIBER ✦

Correlated fluctuations and noise spectra of tunneling and substrate currents before breakdown in thin-oxide MOS devices

✍ Scribed by Saletti, R.; Neri, B.; Olivo, P.; Modelli, A.

Book ID: 114536981
Publisher: IEEE
Year: 1990
Tongue: English
Weight: 312 KB
Volume: 37
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.62302

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[Japan Soc. Appl. Phys International Con

[Japan Soc. Appl. Phys International Conference on Simulation of Semiconductor Process and Devices. SISPAD 99 - Kyoto, Japan (6-8 Sept. 1999)] 1999 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD'99 (IEEE Cat. No.99TH8387) - Self-consistent simulation of quantization effects and tunneling current in ultra-thin gate oxide MOS devices

✍ Ghetti, A.; Hamad, A.; Silverman, P.J.; Vaidya, H.; Zhao, N. 📂 Article 📅 1999 🏛 Japan Soc. Appl. Phys 🌐 Japanese ⚖ 346 KB