Corrections to “Analytical Extraction of Extrinsic and Intrinsic FET Parameters” [Feb 09 254-261]

✍ Scribed by Ooi, B. L.; Zhong, Z.; Leong, M.-S.

• Book ID: 114661275
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 30 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/tmtt.2010.2052407