✦ LIBER ✦
Correction of X-ray detection yield in micro-PIXE analysis according to sample thickness variation measured by STIM
✍ Scribed by T. Satoh; T. Sakai; M. Oikawa
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 751 KB
- Volume
- 249
- Category
- Article
- ISSN
- 0168-583X
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