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Correction of a coherent image during KrF excimer laser ablation using a mask projection

โœ Scribed by Dong Sig Shin; Jae Hoon Lee; Jeong Suh; To Hoon Kim


Book ID
108233292
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
467 KB
Volume
44
Category
Article
ISSN
0143-8166

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Ablation of single and arrayed microstructures using an excimer laser is studied. The single feature microstructures are fabricated for evaluating the ablation mechanism, threshold fluence, and associated material removing (ablation) rate. The morphology changes during ablation are investigated with