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Correction method of secondary reflection effects in measurement of electro-optic coefficient in optically active materials

✍ Scribed by Ph. Lemaire; M. Georges


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
590 KB
Volume
91
Category
Article
ISSN
0030-4018

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The paper presents a technique suitable for the determination of linear electro-optic effect (LEOE) tensor components in crystal materials of any symmetry. The method is based on the Michelson interferometer, where the sample being studied is set into one of its arms to measure the electroinduced ch