Secondary ion yields are known to be strongly enhanced by the presence of oxygen in the analysed sample. The magnitude of the yield enhancement is often signiÐcantly di †erent for impurity and matrix ion species. This kind of SIMS matrix e †ect severely aggravates concentration calibration in depth
✦ LIBER ✦
Correcting the depth profiles broadened by the crater effect: A numerical procedure
✍ Scribed by Zdeněk Weiss
- Book ID
- 104592546
- Publisher
- John Wiley and Sons
- Year
- 1990
- Tongue
- English
- Weight
- 203 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0142-2421
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✦ Synopsis
Abstract
Concentration–depth profiles which are distorted by the crater effect exhibit a special relationship between the concentration vs. depth distribution and the measured signal vs. time response. This relation is given by a linear Volterra integral equation of the first kind with the kernel which can be experimentally evaluated. A numerical procedure is described for the profile correction by solving that equation, along with discussion of existence, uniqueness of the solution and convergence of the approximations to the original profile.
📜 SIMILAR VOLUMES
Concentration-depth calibration and bomb
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Wittmaack, K.
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1998
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🌐
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⚖ 429 KB
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Correction to “The Effect of Concentrati
✍
Smith, James E.; Gillham, Robert W.
📂
Article
📅
1995
🏛
American Geophysical Union
🌐
English
⚖ 28 KB