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Copper tracing to determine the micrometric electronic properties of a thick ferrous corrosion layer formed in an anoxic medium

✍ Scribed by M. Saheb; D. Neff; C. Bataillon; E. Foy; Ph. Dillmann


Book ID
116385706
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
939 KB
Volume
53
Category
Article
ISSN
0010-938X

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