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Copper spacer thickness dependence of the exchange bias in IrMn/Cu/Co ultrathin films

✍ Scribed by S. Nicolodi; L.C.C.M. Nagamine; A.D.C. Viegas; J.E. Schmidt; L.G. Pereira; C. Deranlot; F. Petroff; J. Geshev

Book ID: 113724542
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 251 KB
Volume: 316
Category: Article
ISSN: 0304-8853
DOI: 10.1016/j.jmmm.2007.02.048

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