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Copper oxide phase content and its effect on the electric pulse induced resistive switching characteristics of CuxO resistive random access memory

✍ Scribed by Ebrahim, Rabi; Zomorrodian, Ali; Wu, Naijuan; Ignatiev, Alex


Book ID
121491510
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
684 KB
Volume
539
Category
Article
ISSN
0040-6090

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