Converting a bulk radiation-hardened BiCMOS technology into a dielectrically-isolated process

✍ Scribed by DeLaus, M.; Emily, D.; Mappes, B.; Pease, R.

• Book ID: 119957827
• Publisher: IEEE
• Year: 1993
• Tongue: English
• Weight: 550 KB
• Volume: 40
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.273480