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Controlled variation of the information depth by angle dependent soft X-ray emission spectroscopy: A study on polycrystalline Cu(In,Ga)Se2

✍ Scribed by H. Mönig; I. Lauermann; A. Grimm; C. Camus; C.A. Kaufmann; P. Pistor; Ch. Jung; T. Kropp; M.C. Lux-Steiner; Ch.-H. Fischer


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
557 KB
Volume
255
Category
Article
ISSN
0169-4332

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