Controlled growth of exciton–polariton microcavities using in situ spectral reflectivity measurements

✍ Scribed by K. Biermann; E.A. Cerda-Méndez; M. Höricke; P.V. Santos; R. Hey

• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 460 KB
• Volume: 323
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/j.jcrysgro.2010.10.107

✦ Synopsis

We present an in situ measurement method for the precise control of the molecular beam epitaxial growth of microcavities. The method is based on continuous spectral reflectivity measurements and offers the required precision to monitor and control the growth of exactly tuned polariton microcavity structures.