## Abstract The influence of the voltage applied to the tip of an atomic force microscope (AFM) on the local modification of the surface of CVDβgrown diamond films is studied. By applying a negative voltage to the conductive (highly doped) silicon AFM tip, two kinds of patterns can be created. In t
β¦ LIBER β¦
Control wettability of the hydrogen-terminated diamond surface and the oxidized diamond surface using an atomic force microscope
β Scribed by Kaibara, Yu; Sugata, Kenta; Tachiki, Minoru; Umezawa, Hitoshi; Kawarada, Hiroshi
- Book ID
- 121795537
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 792 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0925-9635
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