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Control of Interfacial Reactivity Between ZrB2and Ni-Based Brazing Alloys

โœ Scribed by F. Valenza; M. L. Muolo; A. Passerone; G. Cacciamani; C. Artini


Book ID
113087557
Publisher
Springer US
Year
2012
Tongue
English
Weight
761 KB
Volume
21
Category
Article
ISSN
1059-9495

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This paper reports on the application of a thin MgO interlayer as a diffusion barrier between a Ni 2 MnIn Heusler film and the substrate consisting of either (0 0 1)InAs or a high electron mobility transistor structure with an InAs channel layer. The functionality of the MgO interlayers is studied i