Control of electromigration in aluminium interconnections : R. Shield and T. H. Ramsey. Proc. 1969 Electron. Compon. Conf., Washington D.C., 30 April–2 May (1969), p. 424

• Publisher: Elsevier Science
• Year: 1969
• Tongue: English
• Weight: 93 KB
• Volume: 8
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(69)90344-8