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Contributions of the environmental scanning electron microscope and X-ray diffraction in investigating the structural evolution of a SiO2aggregate attacked by alkali-silica reaction

✍ Scribed by J. Verstraete; L. Khouchaf; M.H. Tuilier


Book ID
111590832
Publisher
Springer
Year
2004
Tongue
English
Weight
230 KB
Volume
39
Category
Article
ISSN
0022-2461

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