✦ LIBER ✦
Contrast inversion in electrostatic force microscopy imaging of trapped charges: tip–sample distance and dielectric constant dependence
✍ Scribed by Riedel, C; Alegría, A; Arinero, R; Colmenero, J; Sáenz, J J
- Book ID
- 124058529
- Publisher
- Institute of Physics
- Year
- 2011
- Tongue
- English
- Weight
- 729 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0957-4484
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