✦ LIBER ✦
Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films
✍ Scribed by J.D. Clayton; P.W. Chung; M.A. Grinfeld; W.D. Nothwang
- Book ID
- 104049825
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 316 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0093-6413
No coin nor oath required. For personal study only.