Contactless electroreflectance evidence for reduction in the surface potential barrier in AlGaN/GaN heterostructures passivated by SiN layer

✍ Scribed by Kudrawiec, R.; Paszkiewicz, B.; Motyka, M.; Misiewicz, J.; Derluyn, J.; Lorenz, A.; Cheng, K.; Das, J.; Germain, M.

• Book ID: 121682344
• Publisher: American Institute of Physics
• Year: 2008
• Tongue: English
• Weight: 385 KB
• Volume: 104
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.3009956