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Contact Resistance and Trap Density of Oligoaniline Field-Effect Transistor

✍ Scribed by Shou-Zheng Weng; Chin-Tsou Kuo; Shune-Long Wu

Book ID: 111555638
Publisher: Springer
Year: 2003
Tongue: English
Weight: 312 KB
Volume: 10
Category: Article
ISSN: 1022-9760
DOI: 10.1023/a:1026056329995

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