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Contact Instability in Adhesion and Debonding of Thin Elastic Films

โœ Scribed by Gonuguntla, Manoj; Sharma, Ashutosh; Sarkar, Jayati; Subramanian, Subash A.; Ghosh, Moniraj; Shenoy, Vijay


Book ID
121357746
Publisher
The American Physical Society
Year
2006
Tongue
English
Weight
480 KB
Volume
97
Category
Article
ISSN
0031-9007

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We report a study on the contact resistance instability induced by the bias stress in staggered pentacene thin film transistors, combining the bias stress measurements with the transfer line method. The contact resistance is increasing with the stress time, and two device parameters are found to con