✦ LIBER ✦
Construction of SEU Tolerant Flip-Flops Allowing Enhanced Scan Delay Fault Testing
✍ Scribed by Namba, K.; Ikeda, T.; Ito, H.
- Book ID
- 118161853
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 611 KB
- Volume
- 18
- Category
- Article
- ISSN
- 1063-8210
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