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Constricted dislocations and their use for TEM measurements of the velocities of edge and 60° dislocations in silicon. A new approach to the problem of kink migration

✍ Scribed by Gottschalk, H. ;Hiller, N. ;Sauerland, S. ;Specht, P. ;Alexander, H.


Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
501 KB
Volume
138
Category
Article
ISSN
0031-8965

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