✦ LIBER ✦
Constraints on Models of Electrical Transport in Optimally Doped La2−xSrxCuO4from Measurements of Radiation-Induced Defect Resistance
✍ Scribed by J. A. Clayhold; O. Pelleg; D. C. Ingram; A. T. Bollinger; G. Logvenov; D. W. Rench; B. M. Kerns; M. D. Schroer; R. J. Sundling; I. Bozovic
- Publisher
- Springer
- Year
- 2009
- Tongue
- English
- Weight
- 304 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0896-1107
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