✦ LIBER ✦
Constrained test generation for embedded synchronous sequential circuits with serial-input access
✍ Scribed by Pomeranz, I.
- Book ID
- 118698463
- Publisher
- IEEE
- Year
- 2004
- Tongue
- English
- Weight
- 409 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0278-0070
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