Constrained Empirical Risk Minimization Framework for Distance Metric Learning

✍ Scribed by Bian, W.; Tao, D.

• Book ID: 119820120
• Publisher: Institute of Electrical and Electronics Engineers
• Year: 2012
• Tongue: English
• Weight: 773 KB
• Volume: 23
• Category: Article
• ISSN: 2162-237X
• DOI: 10.1109/tnnls.2012.2198075