Constant-Distance Mode Scanning Electrochemical Microscopy (SECM)—Part I: Adaptation of a Non-Optical Shear-Force-Based Positioning Mode for SECM Tips

✍ Scribed by Bernardo Ballesteros Katemann; Albert Schulte; Wolfgang Schuhmann

• Publisher: John Wiley and Sons
• Year: 2003
• Tongue: English
• Weight: 231 KB
• Volume: 9
• Category: Article
• ISSN: 0947-6539
• DOI: 10.1002/chem.200204267