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Constant-Distance Mode Scanning Electrochemical Microscopy. Part II: High-Resolution SECM Imaging Employing Pt Nanoelectrodes as Miniaturized Scanning Probes

✍ Scribed by Bernardo Ballesteros Katemann; Albert Schulte; Wolfgang Schuhmann


Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
144 KB
Volume
16
Category
Article
ISSN
1040-0397

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