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Consistent Relationship Between the Tunnel Magnetoresistance of CoFeB/MgO/CoFeB Junctions and X-Ray Diffraction Properties

✍ Scribed by Il-Jae Shin; Byoung-Chul Min; Jin-Pyo Hong; Kyung-Ho Shin


Book ID
114653014
Publisher
IEEE
Year
2009
Tongue
English
Weight
113 KB
Volume
45
Category
Article
ISSN
0018-9464

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## Abstract The influence of seed‐buffer layers on the texture and tunneling parameters was investigated. The spin valve magnetic tunnel junctions (SV‐MTJs) were deposited onto thermally oxidized Si wafers by magnetron sputtering in the following sequence of layers: substrate Si(100)/SiO~2~ 47 nm/b