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Consistency of photoelectrochemistry and photoelectrochemical microwave reflection demonstrated with p- and n-type layered semiconductors like MoS2

✍ Scribed by Thomas Moehl; Marinus Kunst; Frank Wünsch; Helmut Tributsch


Book ID
108167622
Publisher
Elsevier
Year
2007
Tongue
English
Weight
816 KB
Volume
609
Category
Article
ISSN
1572-6657

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