Consideration on automatic defect detection algorithm for stamped patterns in electronic parts

✍ Scribed by Yoshihiro Shima; Seiji Kashioka; Toshikazu Yasue

• Book ID: 112205883
• Publisher: John Wiley and Sons
• Year: 1989
• Tongue: English
• Weight: 860 KB
• Volume: 20
• Category: Article
• ISSN: 0882-1666
• DOI: 10.1002/scj.4690200805