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Consideration on automatic defect detection algorithm for stamped patterns in electronic parts

โœ Scribed by Yoshihiro Shima; Seiji Kashioka; Toshikazu Yasue


Book ID
112205883
Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
860 KB
Volume
20
Category
Article
ISSN
0882-1666

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