Dynamic force microscopy has proved to be a powerful imaging tool. Here, the tip of an atomic force microscope is vibrated at a high frequency, typically the resonance frequency of the lever sensor, and at a large vibration amplitude, typically of the order of 10 nm. Imaging contrast is obtained fro
Conservative and dissipative tip-sample interaction forces probed with dynamic AFM
β Scribed by Gotsmann, B.; Seidel, C.; Anczykowski, B.; Fuchs, H.
- Book ID
- 118015922
- Publisher
- The American Physical Society
- Year
- 1999
- Tongue
- English
- Weight
- 168 KB
- Volume
- 60
- Category
- Article
- ISSN
- 1098-0121
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