Connection between the Schoeck and the Haasen analysis of thermally activated dislocation glide in semiconductors

✍ Scribed by Zongo, I. ;Farvacque, J. L.

• Publisher: John Wiley and Sons
• Year: 1994
• Tongue: English
• Weight: 315 KB
• Volume: 142
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211420211