Confocal white light reflection imaging for characterization of metal nanostructures

✍ Scribed by C.L. Du; Y.M. You; J. Kasim; Z.H. Ni; T. Yu; C.P. Wong; H.M. Fan; Z.X. Shen

• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 572 KB
• Volume: 281
• Category: Article
• ISSN: 0030-4018
• DOI: 10.1016/j.optcom.2008.07.078