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Confocal Raman Microspectroscopy: A Non-Invasive Approach for in-Depth Analyses of Polymer Substrates

✍ Scribed by J. Pablo Tomba; José M. Pastor


Publisher
John Wiley and Sons
Year
2009
Tongue
English
Weight
272 KB
Volume
210
Category
Article
ISSN
1022-1352

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✦ Synopsis


Abstract

We present a simple approach that avoids the problem of coupling fluid‐sample interaction in confocal Raman depth‐profiling with immersion objectives. We use a thin protective medium (PE film) that preserves the sample from direct contact with the coupling fluid, and that can be readily attached/de‐attached from the sample surface by applying a small difference of pressure. The strategy was tested performing confocal Raman depth profiling studies on a series of transparent substrates (PP films; 25, 44 and 60 µm nominal thickness) and comparing the results with those obtained with conventional approaches. It is shown that the strategy recovers very well all the film features, preserving at the same time a good depth resolution and optical throughput.

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